Testing the Tester: What Broke? Where? When? Why?
نویسنده
چکیده
In recent times in the business of semiconductor testing, the claim has been that Test Cost has begun to dominate the overall cost of product (die + packaging + test) in some product lines. The cost models that I have seen are simplistic models that just take into account the product yield and the per-second test cost. More recently, I have become even more concerned over the effects of Mean-Time-Between-Failures (MTBF) and MeanTime-to-Repair (MTTR), and have found that they are also quite significant in this cost equation (for wafers with thousands of die, downtime can cost in the tens of millions of dollars in throughput loss even for reasonable MTBF and MTTR).
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